Case studies

Four wedges, described honestly.

Chipira is pre-launch. What follows are the four wedge workflows we are designing our design-partner programme around — the problem, the approach, the metric and the baseline. When they carry real results, this page will say so.

Become a design partner

A note on evidence

What this page is, and is not

Most early-stage companies fill this page with composite “case studies” that no customer would recognise. We would rather be useful.

Each workflow below sets out the failure mode, how Chipira attacks it, the metric we would agree to be judged on, and how the baseline is established. The numbers are modelled design targets, marked as such. None of them is a customer result, because we do not yet have customer results to report.

If you are evaluating vendors in this category, we would suggest asking every one of them which numbers on their case-study page are measured, on whose line, and against which baseline. The answers are informative.

Wedge 01

Hybrid-bonding alignment drift

The failure mode

A fraction of a micron, and the module is gone

Hybrid bonding joins surfaces copper pad to copper pad at sub-micron alignment with no tolerance for particles. Placement and rotation drift with thermal state, stage wear and material lot, and the excursion is often only visible after a batch has already been bonded. Approach: continuous alignment metrology feeding a closed-loop correction inside a tight action envelope, with particle flagging escalated to handling before a bond is attempted. Metric: alignment excursions per thousand bonds and bond yield, against a shadow-mode baseline. Status: design-partner programme [ASPIRATIONAL].

Flip-chip bond cross-section with a metrology crosshair reporting sub-micron placement offsets against a closed-loop force and temperature profile.
Alignment offsets tracked continuously and corrected inside the envelope. Chipira design illustration.

Wedge 02

X-ray and CT void detection

The failure mode

The defect that is only visible after the value is spent

Voids under bumps and in the bond line are invisible to the bonding step that produced them and expensive by the time X-ray or CT reveals them. Fixed thresholds either escape real defects or condemn good packages. Approach: fine-tuned volumetric detection at line rate with confidence and evidence attached, feeding automatic rework, re-inspection or scrap disposition before further value is added. Metric: classification accuracy and escape rate against the engineer plus existing inspection baseline; scrap avoided per thousand packages. Status: design-partner programme [ASPIRATIONAL].

X-ray inspection field of a bump array with three flagged void defects boxed and annotated with confidence.
Three voids classified at 0.994 confidence and routed to rework. Chipira design illustration; values are modelled.

Wedge 03

HBM and chiplet stacking optimisation

The failure mode

Good die spent on a stack that was never going to work

In a twelve-high stack, sequencing decides yield. Place a strong die onto a compromised stack and both are lost; order the stack badly and known-good-die loss compounds through the build. Approach: known-good-die sequencing and TSV and underfill planning solved as a real optimisation problem, using perception data from inspection and validated in the twin before placement. Metric: known-good-die loss per stack and composite stack yield, against a shadow-mode baseline. Status: design-partner programme [ASPIRATIONAL].

Twelve-high HBM die stack in cross-section with through-silicon vias and per-die known-good-die scores.
Stack order derived from known-good-die score rather than arrival order. Chipira design illustration.

Wedge 04

Molding, underfill and warpage control

The failure mode

Warpage that scales with the panel

Molding and underfill introduce voids and residual warpage that scale with panel area and drift with material lot and cure profile — and reveal themselves after the package is complete. Approach: warpage prediction from lot, panel history and thermal profile, with flow, pressure and cure controlled in-loop and every recipe change pre-validated in the package-and-line twin. Metric: panel scrap rate and composite yield, plus first-pass spec hit rate on new recipes. Status: design-partner programme [ASPIRATIONAL].

Warpage contour map with a cross-sectional profile comparing as-designed warpage against a twin-optimised recipe.
Modelled peak warpage under an optimised recipe, validated before the run. Chipira design illustration; values are modelled.

Method

How every one of these is measured

The same protocol, whichever wedge you choose.

  1. Define the metric first

    Before installation, we agree the metric, its target, the measurement method and who owns the measurement. It goes in the pilot agreement, not in a slide.

  2. Establish a real baseline

    Shadow mode runs for a defined period with no write-back, producing a measured baseline of the metric under your current practice — including the variance.

  3. Compare like for like

    Assist-mode performance is measured against the engineer plus the existing inspection or control baseline on the same packages, not against a favourable subset.

  4. Publish the result internally

    Whatever the outcome, it is written up with the audit trail attached. A pilot that misses its metric is documented as such.

Show me the shadow-mode variance before you show me the improvement. That is the number that tells me whether you understand my line.

Yield engineering managerAdvanced packaging, high-volume

Composite drawn from design-partner and industry conversations. Illustrative, not a customer endorsement.

Design targets

What we are aiming at

  • Accuracy Defect classification at or above the engineer plus X-ray, SAM and AOI baseline on the wedge workflow.
  • Yield Measurable yield improvement and scrap reduction on the target package family.
  • Ramp Meaningful reduction in weeks from first silicon to target yield on a new package design.
  • KGD Reduction in known-good-die loss — the most expensive material on the line.

These are the categories of metric a pilot is judged on [ASPIRATIONAL]. Specific targets are set per engagement against your measured baseline; we do not publish generic percentage claims.

Design partners

What we are looking for, and what you get

What we ask

One wedge workflow on a package family that matters, SECS-GEM or API access to the relevant tools, a named process or yield engineer to own the pilot, and permission to measure honestly.

  • A defined shadow-mode period
  • Engineer time for review and correction
  • A signed success metric

What you get

Early access to the platform at design-partner commercial terms, direct influence over the connector library and the review console, and an engineering team that treats your line as the specification.

  • Preferential commercial terms
  • Roadmap influence on your tool stack
  • Flagship case study, if you want it

Evidence questions

Fair challenges

  • Because someone has to be first, and being first in a category like this is where the commercial and technical leverage is. The honest counter-argument is that you should wait — and for many organisations that is the right call. We would rather you make it with clear information.

  • Only with your written permission, in the form you approve. Some design partners want the flagship case study; others want their line to remain entirely invisible. Both are fine.

  • Long enough to produce a defensible baseline and a defensible comparison — typically one to two quarters depending on volume and the variance of the metric. Shorter pilots produce numbers nobody believes.

  • Every advanced-packaging line is unusual; that is the nature of the craft. It is why we start with shadow mode on your packages rather than a demo on ours.

Design partners

Be one of the first four.

We are recruiting a small number of design partners across OSATs, IDMs and foundries, each with one measurable wedge workflow. Preferential terms, direct roadmap influence, honest measurement.